Locally most powerful invariant tests for signal detection

IEEE Transactions on Information Theory

Volumn 44, Issue 3, 1998, Pages 1283-1288

  Ramprashad, S A ^a,b   Parks, T W ^a,c  

^a IEEE   (United States)

^b LUCENT TECHNOLOGIES   (United States)

^c Cornell University   (United States)

Author keywords

Invariant test; Locally most powerful test; Uniformly most powerful invariant test

Indexed keywords

COMPUTATIONAL COMPLEXITY; MATHEMATICAL MODELS; PROBABILITY; SPURIOUS SIGNAL NOISE; STATISTICS;

BAYES RULE; NEYMAN-PEARSON TEST;

SIGNAL DETECTION;

EID: 0032074776     PISSN: 00189448     EISSN: None     Source Type: Journal    
DOI: 10.1109/18.669403     Document Type: Article

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