Structural, spectroscopic, and electrochemical characterization of boron-doped diamond films from different provenances

Journal of the Electrochemical Society

Volumn 145, Issue 5, 1998, Pages

  Li, Lin Feng ^a,c   Totir, Dana A ^a,c   Vinokur, Natalia ^a,c   Miller, Barry ^a,c   Chottiner, Gary ^a   Evans, Edward A ^b   Angus, John C ^b,c   Scherson, Daniel A ^a,c  

^a CASE WESTERN RESERVE UNIVERSITY   (United States)

^b Case Western Reserve University   (United States)

^c ELECTROCHEMICAL SOCIETY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; BORON; CRYSTAL IMPURITIES; CYCLIC VOLTAMMETRY; DOPING (ADDITIVES); GRAIN BOUNDARIES; MORPHOLOGY; POLYELECTROLYTES; POLYETHYLENE OXIDES; RAMAN SPECTROSCOPY; SILICON;

LITHIUM PERCHLORATE;

DIAMOND FILMS;

EID: 0032074683     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1838495     Document Type: Article

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