System identification during a transient via wavelet multiresolution analysis followed by spectral techniques

Annals of Nuclear Energy

Volumn 25, Issue 7, 1998, Pages 465-480

  Antonopoulos Domis, M ^a,b   Tambouratzis, T ^a  

^a INSTITUTE OF NUCLEAR TECHNOLOGY AND RADIATION PROTECTION   (Greece)

^b ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

FAST FOURIER TRANSFORMS; IDENTIFICATION (CONTROL SYSTEMS); NUMERICAL ANALYSIS; WAVELET TRANSFORMS;

WAVELET MULTIRESOLUTION ANALYSIS;

TRANSIENTS;

EID: 0032074646     PISSN: 03064549     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0306-4549(97)00070-4     Document Type: Article

References (7)

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4. Donoho, D.L., Johnstone, I.M., (1994). Biometrica 81, 425.
5. Jansen, M., Malfait, M., Bultheel, A., (1997), Signal Processing 56.
6. Johnstone, I.M., Silverman, B.W., (1995). Technical Report 469, Department of Statistics, Stanford University.
7. Mallat, S.G., (1989). IEEE Transactions on Pattern Analysis and Machine Intelligence 11, 674.