Surface melting of A1(110) studied by surface extended X-ray absorption fine structure

Surface Science

Volumn 405, Issue 1, 1998, Pages 112-120

  Polcik, M ^a,b   Wilde, L ^a   Haase, J ^a  

^a FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

^b INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

Aluminium; Extended X ray absorption fine structure (EXAFS); Photon absorption spectroscopy; Single crystal surfaces; Surface melting

Indexed keywords

ANISOTROPY; MELTING; SINGLE CRYSTALS; SURFACE PHENOMENA; SURFACE STRUCTURE; THERMAL EFFECTS; THERMAL EXPANSION;

CUMULANT EXPANSION ANALYSIS; DEBYE WALLER FACTOR; EINSTEIN TEMPERATURE; PHOTON ABSORPTION SPECTROSCOPY; SURFACE EXTENDED X RAY ABSORPTION FINE STRUCTURE (SEXAFS); SURFACE MELTING;

ALUMINUM;

EID: 0032073315     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(98)00059-4     Document Type: Article

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