Microstructure and optical properties of Si - Ag nanocomposite films prepared by co-sputtering

Thin Solid Films

Volumn 320, Issue 2, 1998, Pages 184-191

  Niu, F ^a   Cantor, B ^a   Dobson, P J ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Nanostructures; Optical properties; Silicon; Transmission electron microscopy (TEM)

Indexed keywords

ABSORPTION SPECTROSCOPY; AMORPHOUS SILICON; CRYSTAL MICROSTRUCTURE; LIGHT ABSORPTION; NANOSTRUCTURED MATERIALS; OPTICAL FILMS; OPTICAL PROPERTIES; SEMICONDUCTING SILICON; SILVER; SPECTROMETRY; SPUTTERING; TRANSMISSION ELECTRON MICROSCOPY;

SHENG PING THEORY;

SEMICONDUCTING FILMS;

EID: 0032073037     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)00731-1     Document Type: Article

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