Segregation of oxygen at a solid/liquid interface in silicon

Journal of the Electrochemical Society

Volumn 145, Issue 5, 1998, Pages 1692-1695

  Kakimoto, Koichi ^a   Ozoe, Hiroyuki ^a  

^a KYUSHU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION IN LIQUIDS; PHASE INTERFACES; SILICON; SINGLE CRYSTALS; SOLIDIFICATION;

SEGREGATION COEFFICIENT; TRANSIENT ANALYSIS;

OXYGEN;

EID: 0032072931     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1838541     Document Type: Article

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