X-ray fluorescence analysis of rare-earth atoms in materials by use of ultrashort wavelength X-rays

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 37, Issue 5 PART A, 1998, Pages

  Takahashi, Yasuhiko ^a   Yamamoto, Kazuki ^b   Ohshima, Ken Ichi ^a   Yukino, Ken ^c   Okamura, Fujio P ^c  

^a UNIVERSITY OF TSUKUBA   (Japan)

^b NARA WOMEN'S UNIVERSITY   (Japan)

^c NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Energy dispersive method (EDX); Rare earth hexaborides; Rare earth oxides; Ultrashort wavelength X rays; X ray fluorescence (XRF) analysis

Indexed keywords

ATOMS; COMPOSITION; FLUORESCENCE; OXIDES; RARE EARTHS; SINGLE CRYSTALS; SPECTROSCOPY; X RAYS;

ENERGY DISPERSIVE METHOD; MULTICHANNEL PULSE HEIGHT ANALYZER; RARE EARTH HEXABORIDE; RARE EARTH OXIDE; SOLID STATE DETECTOR; ULTRASHORT WAVELENGTH X RAYS; X RAY FLUORESCENCE ANALYSIS;

X RAY ANALYSIS;

EID: 0032072666     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.37.l556     Document Type: Article

References (6)

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