Structural investigation of 95(0.6Li2S.0.4SiS2).5Li4SiO4 oxysulfide glass by using X-ray photoelectron spectroscopy

Journal of the American Ceramic Society

Volumn 81, Issue 5, 1998, Pages 1305-1309

  Hayashi, Akitoshi ^a   Tatsumisago, Masahiro ^a,c   Minami, Tsutomu ^a,c   Miura, Yoshinari ^b  

^a Osaka Prefecture University   (Japan)

^b OKAYAMA UNIVERSITY   (Japan)

^c AMERICAN CERAMIC SOCIETY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; ELECTRON ENERGY LEVELS; QUENCHING; SULFUR COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

FOUR PEAK DECONVOLUTION TECHNIQUE; OXYSULFIDE GLASS;

GLASS;

EID: 0032071164     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1998.tb02482.x     Document Type: Article

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