SCOPUS 정보 검색 플랫폼

Journal of Crystal Growth

Volumn 187, Issue 2, 1998, Pages 259-267

X-ray characterization of Rb exchanged KTP

(3) Raizman, A a Eger, D a Oron, M a

a SOREQ NUCLEAR RESEARCH CENTER (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; CRYSTALS; ELECTROMAGNETIC WAVE REFLECTION; NONDESTRUCTIVE EXAMINATION; RUBIDIUM; STRAIN; STRESS CONCENTRATION; X RAY CRYSTALLOGRAPHY;

X RAY DOUBLE CRYSTAL DIFFRACTOMETRY;

POTASSIUM COMPOUNDS;

EID: 0032070226 PISSN: 00220248 EISSN: None Source Type: Journal
DOI: 10.1016/S0022-0248(97)00873-7 Document Type: Article

Times cited : (7)

References (24)

1
- 17744368704
- J.D. Bierlein, A. Ferretti, L.H. Brixner, W.Y. Hsu, Appl. Phys. Lett. 50 (1987) 1216.
- (1987) Appl. Phys. Lett. , vol.50 , pp. 1216
- Bierlein, J.D.¹ Ferretti, A.² Brixner, L.H.³ Hsu, W.Y.⁴

2
- 0027687156
- D. Eger, M. Oron, M. Katz, J. Appl. Phys. 74 (1993) 4298.
- (1993) J. Appl. Phys. , vol.74 , pp. 4298
- Eger, D.¹ Oron, M.² Katz, M.³

3
- 0028443880
- D. Eger, M. Oron, M. Katz, A. Zussman, Appl. Phys. Lett. 64 (1994) 3208.
- (1994) Appl. Phys. Lett. , vol.64 , pp. 3208
- Eger, D.¹ Oron, M.² Katz, M.³ Zussman, A.⁴

4
- 0346214701
- unpublished results
- D. Eger, M. Oron, unpublished results (1993).
- (1993)
- Eger, D.¹ Oron, M.²

5
- 84957548665
- J.D. Bierlein, H. Vanherzeele, J. Opt. Soc. Am. B 6 (1989) 622.
- (1989) J. Opt. Soc. Am. B , vol.6 , pp. 622
- Bierlein, J.D.¹ Vanherzeele, H.²

6
- 0346214702
- R. Duhlev, C.W. Pitt, P.A. Thomas, A.G. James, G.W. Grime, Proc. SPIE, 1985, p. 767.
- (1985) Proc. SPIE , pp. 767
- Duhlev, R.¹ Pitt, C.W.² Thomas, P.A.³ James, A.G.⁴ Grime, G.W.⁵

7
- 0016891860
- J.M. White, P.F. Heidrich, Appl. Opt. 15 (1976) 151.
- (1976) Appl. Opt. , vol.15 , pp. 151
- White, J.M.¹ Heidrich, P.F.²

8
- 0014505306
- P.K. Tien, R. Ulrich, R.J. Martin, Appl. Phys. Lett. 14 (1969) 291.
- (1969) Appl. Phys. Lett. , vol.14 , pp. 291
- Tien, P.K.¹ Ulrich, R.² Martin, R.J.³

9
- 0004664783
- W.P. Risk, Appl. Phys. Lett. 58 (1991) 19.
- (1991) Appl. Phys. Lett. , vol.58 , pp. 19
- Risk, W.P.¹

10
- 0017016459
- F. Zumsteg, J.D. Bierlein, T.E. Gier, J. Appl. Phys. 7 (1976) 4980.
- (1976) J. Appl. Phys. , vol.7 , pp. 4980
- Zumsteg, F.¹ Bierlein, J.D.² Gier, T.E.³

11
- 0026138099
- L.K. Cheng, J.D. Bierlein, A.A. Ballman, J. Crystal Growth 110 (1991) 697.
- (1991) J. Crystal Growth , vol.110 , pp. 697
- Cheng, L.K.¹ Bierlein, J.D.² Ballman, A.A.³

12
- 33644667395
- W.J. Bartels, W. Nijman, J. Crystal Growth 44 (1978) 518.
- (1978) J. Crystal Growth , vol.44 , pp. 518
- Bartels, W.J.¹ Nijman, W.²

13
- 0346845353
- J. Matsui, K. Onabe, T. Kamejima, I. Hayashi, J. Elecrochem. Soc. 126 (1979) 667.
- (1979) J. Elecrochem. Soc. , vol.126 , pp. 667
- Matsui, J.¹ Onabe, K.² Kamejima, T.³ Hayashi, I.⁴

14
- 0012065689
- K. Sugii, M. Fukuma, H. Iwasaki, J. Mater. Sci. 13 (1978) 523.
- (1978) J. Mater. Sci. , vol.13 , pp. 523
- Sugii, K.¹ Fukuma, M.² Iwasaki, H.³

15
- 84972932577
- H. Weixing, H. Wangxiang, Z. Yangxing, T. Haoran, C. Jingi, Ferroelectrics 119 (1991) 1.
- (1991) Ferroelectrics , vol.119 , pp. 1
- Weixing, H.¹ Wangxiang, H.² Yangxing, Z.³ Haoran, T.⁴ Jingi, C.⁵

16
- 36549095819
- R. Hull, J.C. Bean, C. Buescher, J. Appl. Phys. 66 (1989) 5837.
- (1989) J. Appl. Phys. , vol.66 , pp. 5837
- Hull, R.¹ Bean, J.C.² Buescher, C.³

17
- 84956263829
- J.C. Bean, L.C. Feldman, A.T. Fiory, S. Nakahara, I.K. Robinson, J. Vac. Sci. Technol. A 2 (1984) 436.
- (1984) J. Vac. Sci. Technol. A , vol.2 , pp. 436
- Bean, J.C.¹ Feldman, L.C.² Fiory, A.T.³ Nakahara, S.⁴ Robinson, I.K.⁵

18
- 0003781076
- Oxford University Press, London, ch. 8
- J.F. Nye, Physical Properties of Crystals, Oxford University Press, London, 1957, ch. 8.
- (1957) Physical Properties of Crystals
- Nye, J.F.¹

19
- 36849101412
- F. Witt, R.W. Vook, J. Appl. Phys. 39 (1968) 2773.
- (1968) J. Appl. Phys. , vol.39 , pp. 2773
- Witt, F.¹ Vook, R.W.²

20
- 0026946090
- D.K.T. Chu, J.D. Bierlein, R.G. Hunsperger, IEEE Trans. on Ultrasonics, Ferroelectrics and Frequency Control 39 (1992) 683.
- (1992) IEEE Trans. on Ultrasonics, Ferroelectrics and Frequency Control , vol.39 , pp. 683
- Chu, D.K.T.¹ Bierlein, J.D.² Hunsperger, R.G.³

21
- 0003427458
- Addison-Wesley, Reading, MA
- B.D. Culity, Elements of X-ray Diffraction, Addison-Wesley, Reading, MA, 1978.
- (1978) Elements of X-ray Diffraction
- Culity, B.D.¹

22
- 84948507025
- I. Tordjman, R. Masse, J.C. Guitel, Z. Kristallogr. 139 (1974) 103.
- (1974) Z. Kristallogr. , vol.139 , pp. 103
- Tordjman, I.¹ Masse, R.² Guitel, J.C.³

23
- 0007063702
- J. Chaudhuri, S. Shah, J.P. Harbison, J. Appl. Phys. 66 (1989) 5373.
- (1989) J. Appl. Phys. , vol.66 , pp. 5373
- Chaudhuri, J.¹ Shah, S.² Harbison, J.P.³

24
- 36549092832
- J.D. Bierlien, C.B. Arweiler, Appl. Phys. Lett. 49 (1986) 917.
- (1986) Appl. Phys. Lett. , vol.49 , pp. 917
- Bierlien, J.D.¹ Arweiler, C.B.²

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