Study of the environment effect on the properties of BDN-SA Langmuir - Blodgett films

Thin Solid Films

Volumn 320, Issue 2, 1998, Pages 316-319

  Yang, De Quan ^a   Sun, Yan ^a   Xie, Shu Ping ^a   Wang, Run Fu ^a   Guo, Yun ^a   Fan, Chui Zhen ^a   Da, Dao An ^a  

^a CHINA ACADEMY OF SPACE TECHNOLOGY   (China)

Author keywords

Electrical properties and measurements; Langmuir Blodgett films; X ray photoelectron spectroscopy

Indexed keywords

ELECTRIC RESISTANCE MEASUREMENT; NITROGEN COMPOUNDS; OXIDATION; REDUCTION; X RAY PHOTOELECTRON SPECTROSCOPY;

NITROGEN HYDRIDE;

LANGMUIR BLODGETT FILMS;

EID: 0032070165     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)00947-4     Document Type: Article

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