Real-time phase imaging for nondestructive testing

Experimental Techniques

Volumn 22, Issue 3, 1998, Pages 15-17

  Stetson, K A ^a   Wahid, J ^b  

^a Karl Stetson Associates   (United States)

^b Recognition Technology Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL GEOMETRY; IMAGE ANALYSIS; IMAGE QUALITY; NONDESTRUCTIVE EXAMINATION; OPTICAL IMAGE STORAGE; PERTURBATION TECHNIQUES; PROGRAM PROCESSORS; REAL TIME SYSTEMS;

REAL TIME PHASE IMAGING; WRAPPED PHASE IMAGES;

HOLOGRAPHIC INTERFEROMETRY;

EID: 0032069881     PISSN: 07328818     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1747-1567.1998.tb01278.x     Document Type: Article

References (3)

1. J. Wang and I. Grant, "Electronic speckle interferometry, phase-mapping, and nondestructive testing techniques applied to real-time thermal loading," Appl. Opt. 34, 3620-3627 (1995).
2. K. Creath, "Phase-shifting speckle interferometry," Appl. Opt. 24, 3053-3058 (1985).
3. K.A. Stetson and W.R. Brohinsky, "Electro-optic holography and its application to hologram interferometry," Appl. Opt. 24, 3631-3637 (1985).