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Volumn 409, Issue 1-3, 1998, Pages 275-277
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Production testing issues for ASICs for high energy physics
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Author keywords
[No Author keywords available]
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Indexed keywords
HIGH ENERGY PHYSICS;
INTEGRATED CIRCUIT LAYOUT;
INTEGRATED CIRCUIT TESTING;
NUCLEAR INSTRUMENTATION;
PRODUCTION TESTING;
APPLICATION SPECIFIC INTEGRATED CIRCUITS;
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EID: 0032068971
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(97)01279-5 Document Type: Article |
Times cited : (1)
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References (0)
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