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Volumn 42, Issue 3-4, 1998, Pages 347-358

Silicon light-valve array chip for high-resolution reflective liquid crystal projection displays

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; CRYSTALLINE MATERIALS; ELECTRIC NETWORK ANALYSIS; ELECTRIC NETWORK SYNTHESIS; MICROPROCESSOR CHIPS; OPTICAL PROJECTORS; SEMICONDUCTING SILICON;

EID: 0032068531     PISSN: 00188646     EISSN: None     Source Type: Journal    
DOI: 10.1147/rd.423.0347     Document Type: Article
Times cited : (23)

References (12)
  • 2
    • 0032065183 scopus 로고    scopus 로고
    • Nematic LC Modes and LC Phase Gratings for Reflective Spatial Light Modulators
    • K. H. Yang and M. Lu, "Nematic LC Modes and LC Phase Gratings for Reflective Spatial Light Modulators," IBM J. Res. Develop. 42, No. 3/4, 401-410 (1998, this issue).
    • (1998) IBM J. Res. Develop. , vol.42 , Issue.3-4 THIS ISSUE , pp. 401-410
    • Yang, K.H.1    Lu, M.2
  • 3
    • 0032068979 scopus 로고    scopus 로고
    • On-Chip Metallization Layers for Reflective Light Valves
    • E. G. Colgan and M. Uda, "On-Chip Metallization Layers for Reflective Light Valves," IBM J. Res. Develop. 42, No. 3/4, 339-345 (1998, this issue).
    • (1998) IBM J. Res. Develop. , vol.42 , Issue.3-4 THIS ISSUE , pp. 339-345
    • Colgan, E.G.1    Uda, M.2
  • 4
    • 0032065113 scopus 로고    scopus 로고
    • Projection Display Throughput: Efficiency of Optical Transmission and Light-Source Collection
    • F. E. Doany, R. N. Singh, A. E. Rosenbluth, and G. L.-T. Chiu, "Projection Display Throughput: Efficiency of Optical Transmission and Light-Source Collection," IBM J. Res. Develop. 42, No. 3/4, 387-399 (1998, this issue).
    • (1998) IBM J. Res. Develop. , vol.42 , Issue.3-4 THIS ISSUE , pp. 387-399
    • Doany, F.E.1    Singh, R.N.2    Rosenbluth, A.E.3    Chiu, G.L.-T.4
  • 5
    • 12844274059 scopus 로고
    • An Overview of the Performance Envelope of Digital-Micromirror-Device-Based Projection Display Systems
    • Society for Information Display International Symposium
    • J. P. Sampsell, "An Overview of the Performance Envelope of Digital-Micromirror-Device-Based Projection Display Systems," Digest of Technical Papers, Society for Information Display International Symposium, 1994, pp. 669-672.
    • (1994) Digest of Technical Papers , pp. 669-672
    • Sampsell, J.P.1
  • 8
    • 3843096465 scopus 로고    scopus 로고
    • An 0.8 Micron EEPROM Technology Modified for Reflective PDLV Light-Valve Application
    • Society for Information Display International Symposium
    • P. Cacharelis, U. S. Kim, J. Frazee, P. Moore, K. Brown, R. Luttrell, P. Renteln, and R. Flack, "An 0.8 Micron EEPROM Technology Modified for Reflective PDLV Light-Valve Application," Digest of Technical Papers, Society for Information Display International Symposium, 1997, p. 289.
    • (1997) Digest of Technical Papers , pp. 289
    • Cacharelis, P.1    Kim, U.S.2    Frazee, J.3    Moore, P.4    Brown, K.5    Luttrell, R.6    Renteln, P.7    Flack, R.8
  • 10
    • 19444362370 scopus 로고
    • Department of Electrical Engineering and Computer Science, University of California, Berkeley, June 28
    • J. H. Huang, Z. H. Liu, M. C. Jeng, K. Hui, M. Chan, P. K. Ko, and C. Hu, BSIM3 Manual, Version 1.0, Department of Electrical Engineering and Computer Science, University of California, Berkeley, June 28, 1993.
    • (1993) BSIM3 Manual, Version 1.0
    • Huang, J.H.1    Liu, Z.H.2    Jeng, M.C.3    Hui, K.4    Chan, M.5    Ko, P.K.6    Hu, C.7
  • 11
    • 0016057948 scopus 로고
    • Modeling Distributed RC Line for the Transient Analysis of Complex Networks
    • Y. V. Rajput, "Modeling Distributed RC Line for the Transient Analysis of Complex Networks," Int. J. Electron. 36, No. 5, 709-717 (1974).
    • (1974) Int. J. Electron. , vol.36 , Issue.5 , pp. 709-717
    • Rajput, Y.V.1
  • 12
    • 3843099697 scopus 로고
    • Use of Electron-Beam Charging or In-Process Inspection of Silicon Complementary Metal-Oxide Semiconductor Gate Electrode Isolation
    • K. A. Jenkins, P. D. Agnello, and A. A. Bright, "Use of Electron-Beam Charging or In-Process Inspection of Silicon Complementary Metal-Oxide Semiconductor Gate Electrode Isolation," Appl. Phys. Lett. 61, 312-314 (1992).
    • (1992) Appl. Phys. Lett. , vol.61 , pp. 312-314
    • Jenkins, K.A.1    Agnello, P.D.2    Bright, A.A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.