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Volumn 321, Issue 1-2, 1998, Pages 234-240

Epitaxial Si/SiO2 low dimensional structures

Author keywords

Low dimensional structures; Molecular beam epitaxy; Si SiO2

Indexed keywords

MOLECULAR BEAM EPITAXY; NANOSTRUCTURED MATERIALS; OPTOELECTRONIC DEVICES; SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR QUANTUM DOTS; SEMICONDUCTOR QUANTUM WIRES; SILICA;

EID: 0032068272     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)00479-9     Document Type: Article
Times cited : (8)

References (28)
  • 27
    • 0029390345 scopus 로고
    • S. Fukatsu, J. Mater. Sci. Mater. Electron 6 (1995) 341; S. Fukatsu, in: Y. Kanemitsu, T. Ogawa (eds.), Optical Properties of Low Dimensional Materials, Vol. 2, World Scientific, Singapore, 1998, Chap. 5, in press.
    • (1995) J. Mater. Sci. Mater. Electron , vol.6 , pp. 341
    • Fukatsu, S.1
  • 28
    • 0347692101 scopus 로고    scopus 로고
    • Y. Kanemitsu, T. Ogawa (eds.), World Scientific, Singapore, Chap. 5, in press
    • S. Fukatsu, J. Mater. Sci. Mater. Electron 6 (1995) 341; S. Fukatsu, in: Y. Kanemitsu, T. Ogawa (eds.), Optical Properties of Low Dimensional Materials, Vol. 2, World Scientific, Singapore, 1998, Chap. 5, in press.
    • (1998) Optical Properties of low Dimensional Materials , vol.2
    • Fukatsu, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.