메뉴 건너뛰기




Volumn 4, Issue 3, 1998, Pages 564-569

Hydration effects in the photoassisted wet chemical etching of gallium nitride

Author keywords

GaN; Hydration effect; Wet etching

Indexed keywords

ETCHING; ETHANOL; HYDRATION; PH EFFECTS; POTASSIUM COMPOUNDS; SAPPHIRE; SEMICONDUCTOR DOPING; SEMICONDUCTOR GROWTH;

EID: 0032067970     PISSN: 1077260X     EISSN: None     Source Type: Journal    
DOI: 10.1109/2944.704119     Document Type: Article
Times cited : (16)

References (47)
  • 2
    • 2442609542 scopus 로고    scopus 로고
    • Room-temperature continuous-wave operation of InGaN multi-quantum-well-structure laser diodes with a long lifetime
    • S. Nakamura, M. Senoh, S. Nagahama, N. Isawa, T. Yamada, T. Matsushita, Y. Sugimoto, and H. Kiyoku, "Room-temperature continuous-wave operation of InGaN multi-quantum-well-structure laser diodes with a long lifetime," Appl. Phys. Lett., vol. 70, pp. 868-870, 1997.
    • (1997) Appl. Phys. Lett. , vol.70 , pp. 868-870
    • Nakamura, S.1    Senoh, M.2    Nagahama, S.3    Isawa, N.4    Yamada, T.5    Matsushita, T.6    Sugimoto, Y.7    Kiyoku, H.8
  • 4
    • 0029388336 scopus 로고
    • Emerging gallium nitride based devices
    • S. N. Mohammad, A. A. Salvador, and H. Morkoç, "Emerging gallium nitride based devices," Proc. IEEE, vol. 83, pp. 1306-1355, 1995.
    • (1995) Proc. IEEE , vol.83 , pp. 1306-1355
    • Mohammad, S.N.1    Salvador, A.A.2    Morkoç, H.3
  • 10
    • 0026897567 scopus 로고
    • Chemical etching of indium nitride
    • Q. X. Guo, O. Kato, and A. Yoshida, "Chemical etching of indium nitride," J. Electrochem. Soc., vol. 139, pp. 2008-2009, 1992.
    • (1992) J. Electrochem. Soc. , vol.139 , pp. 2008-2009
    • Guo, Q.X.1    Kato, O.2    Yoshida, A.3
  • 12
    • 0000568101 scopus 로고
    • Electrolytic etching of GaN
    • J. I. Pankove, "Electrolytic etching of GaN," J. Electrochem. Soc., vol. 119, pp. 1118-1119, 1972.
    • (1972) J. Electrochem. Soc., Vol. , vol.119 , pp. 1118-1119
    • Pankove, J.I.1
  • 14
    • 0004193138 scopus 로고
    • J. L. Vossen and W. Kern, Eds. New York: Academic
    • W. Kern and C. A. Deckert, in Thin Film Process, J. L. Vossen and W. Kern, Eds. New York: Academic, 1978.
    • (1978) Thin Film Process
    • Kern, W.1    Deckert, C.A.2
  • 15
    • 0043222034 scopus 로고
    • Photoetching and plating of gallium arsenide
    • R. W. Haisty, "Photoetching and plating of gallium arsenide," J. Electrochem. Soc., vol. 108, pp. 790-794, 1961.
    • (1961) J. Electrochem. Soc. , vol.108 , pp. 790-794
    • Haisty, R.W.1
  • 16
    • 0022667222 scopus 로고
    • Waveguide effects in laser-induced aqueous etching of semicondutors
    • D. V. Podlesnik, H. H. Gilgen, and R. M. Osgood, Jr., "Waveguide effects in laser-induced aqueous etching of semicondutors," Appl. Phys. Lett., vol. 48, pp. 496-498, 1986.
    • (1986) Appl. Phys. Lett. , vol.48 , pp. 496-498
    • Podlesnik, D.V.1    Gilgen, H.H.2    Osgood Jr., R.M.3
  • 17
    • 0027577999 scopus 로고
    • Effect of band structure on etch-stop layers in the photoelectrochemical etching of GaAs/AlGaAs semiconductor structures
    • R. Khare, D. B. Young, G. L. Snider, and E. L. Hu, "Effect of band structure on etch-stop layers in the photoelectrochemical etching of GaAs/AlGaAs semiconductor structures," Appl. Phys. Lett., vol. 62, pp. 1809-1811, 1993.
    • (1993) Appl. Phys. Lett. , vol.62 , pp. 1809-1811
    • Khare, R.1    Young, D.B.2    Snider, G.L.3    Hu, E.L.4
  • 19
    • 0142132922 scopus 로고
    • Analysis of determining factors in the kinetics of anisotropic photoetching of GaAs
    • J. van de Ven and H. J. P. Nabben, "Analysis of determining factors in the kinetics of anisotropic photoetching of GaAs," J. Appl. Phys., vol. 67, pp. 7572-7575, 1990.
    • (1990) J. Appl. Phys. , vol.67 , pp. 7572-7575
    • Van De Ven, J.1    Nabben, H.J.P.2
  • 20
    • 3843132995 scopus 로고    scopus 로고
    • Electrochemical CV profiling of group III-nitrides
    • Bio-Rad, May/June
    • Bio-Rad, "Electrochemical CV profiling of group III-nitrides," Compound Semiconductor, pp. 14-15, May/June 1997.
    • (1997) Compound Semiconductor , pp. 14-15
  • 21
    • 0030103958 scopus 로고    scopus 로고
    • Room-temperature photoenhanced wet etching of GaN
    • M. S. Minsky, M. White, and E. L. Hu, "Room-temperature photoenhanced wet etching of GaN," Appl. Phys. Lett., vol. 68, pp. 1531-1533, 1996.
    • (1996) Appl. Phys. Lett. , vol.68 , pp. 1531-1533
    • Minsky, M.S.1    White, M.2    Hu, E.L.3
  • 22
    • 0030783570 scopus 로고    scopus 로고
    • Broad-area photoelectrochemical etching of GaN
    • C. Youtsey, I. Adesida, and G. Bulman, "Broad-area photoelectrochemical etching of GaN," Electron. Lett., vol. 33, pp. 245-246, 1997.
    • (1997) Electron. Lett. , vol.33 , pp. 245-246
    • Youtsey, C.1    Adesida, I.2    Bulman, G.3
  • 23
    • 0030824509 scopus 로고    scopus 로고
    • Photoassisted anodic etching of gallium nitride
    • H. Lu, Z. Wu, and I. Bhat, "Photoassisted anodic etching of gallium nitride," J. Electrochem. Soc., vol. 144, pp. L8-L11, 1997.
    • (1997) J. Electrochem. Soc. , vol.144
    • Lu, H.1    Wu, Z.2    Bhat, I.3
  • 24
    • 0017534574 scopus 로고
    • Temperature rise by a laser beam
    • M. Lax, "Temperature rise by a laser beam," J. Appl. Phys., vol. 48, pp. 3919-3924, 1977.
    • (1977) J. Appl. Phys. , vol.48 , pp. 3919-3924
    • Lax, M.1
  • 26
  • 27
    • 84975598782 scopus 로고
    • Interaction of deep-ultraviolet laser light with GaAs surfaces in aqueous solutions
    • D. V. Podlesnik, H. H. Gilgen, A. E. Willner, and R. M. Osgood, Jr., "Interaction of deep-ultraviolet laser light with GaAs surfaces in aqueous solutions," J. Opt. Soc. Amer. B, vol. 3, pp. 775-783, 1986.
    • (1986) J. Opt. Soc. Amer. B , vol.3 , pp. 775-783
    • Podlesnik, D.V.1    Gilgen, H.H.2    Willner, A.E.3    Osgood Jr., R.M.4
  • 28
    • 0001610848 scopus 로고
    • Becquerel photovoltaic effect in binary compounds
    • R. Williams, "Becquerel photovoltaic effect in binary compounds," J. Chem. Phys., vol. 32, pp. 1505-1515, 1960.
    • (1960) J. Chem. Phys. , vol.32 , pp. 1505-1515
    • Williams, R.1
  • 30
    • 0031120767 scopus 로고    scopus 로고
    • Ultraviolet-sensitive, visible-blend GaN photodiodes fabricated by molecular beam epitaxy
    • J. M. Van Hove, R. Hickman, J. J. Klaassen, P. P. Chow, and P. P. Ruden, "Ultraviolet-sensitive, visible-blend GaN photodiodes fabricated by molecular beam epitaxy," Appl. Phys. Lett., vol. 70, pp. 2282-2284, 1997.
    • (1997) Appl. Phys. Lett. , vol.70 , pp. 2282-2284
    • Van Hove, J.M.1    Hickman, R.2    Klaassen, J.J.3    Chow, P.P.4    Ruden, P.P.5
  • 31
    • 0001007330 scopus 로고    scopus 로고
    • Electrical field effect on excitons in gallium nitride
    • F. Binet, J. Dubuz, E. Rosencher, F. Scholz, and V. Harle, "Electrical field effect on excitons in gallium nitride," Phys. Rev. B, vol. 54, pp. 8116-8121, 1996.
    • (1996) Phys. Rev. B , vol.54 , pp. 8116-8121
    • Binet, F.1    Dubuz, J.2    Rosencher, E.3    Scholz, F.4    Harle, V.5
  • 32
    • 0031124281 scopus 로고    scopus 로고
    • Deep levels and persistent photoconductivity in GaN thin films
    • C. H. Qiu and J. I. Pankove, "Deep levels and persistent photoconductivity in GaN thin films," Appl. Phys. Lett., vol. 70, pp. 1983-1985, 1997.
    • (1997) Appl. Phys. Lett. , vol.70 , pp. 1983-1985
    • Qiu, C.H.1    Pankove, J.I.2
  • 33
    • 36448999228 scopus 로고
    • Study of defect states in GaN films by photoconductivity measurement
    • C. H. Qiu, C. Hoggatt, W. Melton, M. W. Leksono, and J. I. Pankove, "Study of defect states in GaN films by photoconductivity measurement," Appl. Phys. Lett., vol. 66, pp. 2712-2714, 1995.
    • (1995) Appl. Phys. Lett. , vol.66 , pp. 2712-2714
    • Qiu, C.H.1    Hoggatt, C.2    Melton, W.3    Leksono, M.W.4    Pankove, J.I.5
  • 36
    • 0012061974 scopus 로고
    • Hole transport equation analysis of photoelectrochemical etching resolution
    • F. W. Ostermayer, Jr., P. A. Kohl, and R. M. Lum, "Hole transport equation analysis of photoelectrochemical etching resolution," J. Appl. Phys., vol. 58, pp. 4390-4396, 1986.
    • (1986) J. Appl. Phys. , vol.58 , pp. 4390-4396
    • Ostermayer Jr., F.W.1    Kohl, P.A.2    Lum, R.M.3
  • 37
    • 0019002772 scopus 로고
    • Hot carrier injection at semiconductor-electrolyte junctions
    • D. S. Boudreaux, F. Williams, and J. A. Nozik, "Hot carrier injection at semiconductor-electrolyte junctions," J. Appl. Phys., vol. 51, pp. 2158-2163, 1980.
    • (1980) J. Appl. Phys. , vol.51 , pp. 2158-2163
    • Boudreaux, D.S.1    Williams, F.2    Nozik, J.A.3
  • 39
    • 0027641129 scopus 로고
    • Broad-area photoelectrochemical etching of n-type SiC
    • J. S. Shor and R. M. Osgood, Jr., "Broad-area photoelectrochemical etching of n-type SiC," J. Electrochem. Soc., vol. 140, pp. L123-L125, 1993.
    • (1993) J. Electrochem. Soc. , vol.140
    • Shor, J.S.1    Osgood Jr., R.M.2
  • 40
    • 0030247482 scopus 로고    scopus 로고
    • Potential-induced changes in the surface morphology of (100) n-InP samples photoelectrochemically etched
    • D. Soltz and L. Cescato, "Potential-induced changes in the surface morphology of (100) n-InP samples photoelectrochemically etched," J. Electrochem. Soc., vol. 143, pp. 2815-2821, 1996.
    • (1996) J. Electrochem. Soc. , vol.143 , pp. 2815-2821
    • Soltz, D.1    Cescato, L.2
  • 42
    • 0030569846 scopus 로고    scopus 로고
    • Photoassisted dry etching of GaN
    • R. T. Leonard and S. M. Bedair, "Photoassisted dry etching of GaN," Appl. Phys. Lett., vol. 68, pp. 794-796, 1996.
    • (1996) Appl. Phys. Lett. , vol.68 , pp. 794-796
    • Leonard, R.T.1    Bedair, S.M.2
  • 43
    • 0000411316 scopus 로고
    • On the mechanism of chemically etching germanium and silicon
    • D. R. Turner, "On the mechanism of chemically etching germanium and silicon," J. Electrochem. Soc., vol. 107, pp. 810-816, 1960.
    • (1960) J. Electrochem. Soc. , vol.107 , pp. 810-816
    • Turner, D.R.1
  • 44
    • 0030247282 scopus 로고    scopus 로고
    • Photoelectrochemical etching of p-InP in nitric acid solutions
    • K. P. Quinlan, "Photoelectrochemical etching of p-InP in nitric acid solutions," J. Electrochem. Soc., vol. 143, pp. L200-202, 1996.
    • (1996) J. Electrochem. Soc. , vol.143
    • Quinlan, K.P.1
  • 45
    • 0026142149 scopus 로고
    • Hydration model for the molarity dependence of the etch rate of Si in aqueous alkali hydroxides
    • O. J. Glembocki, E. D. Palik, G. R. de Guel, and D. L. Kendall, "Hydration model for the molarity dependence of the etch rate of Si in aqueous alkali hydroxides," J. Electrochem. Soc., vol. 138, pp. 1055-1063, 1991.
    • (1991) J. Electrochem. Soc. , vol.138 , pp. 1055-1063
    • Glembocki, O.J.1    Palik, E.D.2    De Guel, G.R.3    Kendall, D.L.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.