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Volumn 36, Issue 1, 1998, Pages 67-72
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Characterising semi-refined iota-carrageenan networks by atomic force microscopy
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Author keywords
AFM; Atomic Force Microscopy; Bacterial cellulose; Plant cell walls; PNG carrageenan; Semi refined carrageenan; X ray diffraction
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Indexed keywords
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EID: 0032067776
PISSN: 01448617
EISSN: None
Source Type: Journal
DOI: 10.1016/S0144-8617(97)00112-4 Document Type: Article |
Times cited : (30)
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References (19)
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