Accurate D0 values for SiF and SiF +

Chemical Physics Letters

Volumn 287, Issue 3-4, 1998, Pages 239-242

  Ricca, Alessandra ^a   Bauschlicher Jr , Charles W ^a  

^a NASA AMES RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032067542     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0009-2614(98)00166-3     Document Type: Article

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