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Volumn 21, Issue 4-6, 1998, Pages 589-596

Structure analysis of mesoporous material 'FSM-16' studies by electron microscopy and X-ray diffraction

Author keywords

Crystal growth mechanism; Electron microscopy; FSM 16; Mesoporous; X ray diffraction

Indexed keywords

CRYSTAL GROWTH; CRYSTAL SYMMETRY; HIGH RESOLUTION ELECTRON MICROSCOPY; POROUS MATERIALS; X RAY CRYSTALLOGRAPHY; X RAY POWDER DIFFRACTION;

EID: 0032066513     PISSN: 13871811     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1387-1811(98)00053-5     Document Type: Article
Times cited : (53)

References (6)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.