Photoquenching of excitonic inhomogeneous linewidth in semiconductor microcavities

Solid State Communications

Volumn 106, Issue 8, 1998, Pages 485-489

  Stanley, R P ^a   Houdre R ^a   Oesterle, U ^a   Ilegems, M ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; ELECTRON SPECTROSCOPY; ENERGY GAP; EXCITONS; LIGHT REFLECTION; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR DEVICES;

EXCITON INHOMOGENEOUS LINEWIDTH; PHOTOQUENCHING; SEMICONDUCTOR MICROCAVITIES;

CAVITY RESONATORS;

EID: 0032065730     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1098(98)00094-5     Document Type: Article

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