Informative experimental design for electronic circuits

Quality and Reliability Engineering International

Volumn 14, Issue 3, 1998, Pages 177-186

  Malik, Zahid ^a,c   Su, Hua ^a,b,d,e   Nelder, John ^a,f,g  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

^b NATIONAL SEMICONDUCTOR CORPORATION   (United States)

^c UNIVERSITY OF PORTSMOUTH   (United Kingdom)

^d PEKING UNIVERSITY   (China)

^e OHIO STATE UNIVERSITY   (United States)

^f Ohio State University ^*

^g Royal Statistical Society   (United States)

Author keywords

Circuit design; Design of experiments; Response surface methodology; Statistical model fitting

Indexed keywords

MATHEMATICAL MODELS; NETWORKS (CIRCUITS); NUMERICAL METHODS; RANDOM PROCESSES; STATISTICAL METHODS;

RESPONSE SURFACE METHODOLOGY; STATISTICAL MODEL FITTING;

INTEGRATED CIRCUIT LAYOUT;

EID: 0032064412     PISSN: 07488017     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1099-1638(199805/06)14:3<177::aid-qre153>3.0.co;2-n     Document Type: Article

References (6)

1. G. E. P Box, W. G. Hunter and J. S. Hunter, Statistics for Experiments, Wiley, New York, 1978.
2. G. E. P. Box and N. R. Draper, Empirical Model-Building and Response Surfaces, Wiley, New York, 1987.
3. D. C. Montgomery, Design and Analysis of Experiments, 4th edn, Wiley, New York, 1997.
4. R. Spence and R. S. Soin, Tolerance Design of Electronic Circuits, Addison-Wesley, Reading, MA, 1988.
5. H. Su, J. A. Neider, R. Spence and M. Ismail, 'Generalized linear models for empirical performance modelling in circuit design', Proc. IEEE Asian-Pacific Conf. on Circuits and Systems, IEEE, New York, 1994, pp. 131-136.
6. H. O. Hartley, 'Smallest composite design for quadratic response surfaces', Biometrics, 15, 611-624 (1959).