Better graphs for dependability modeling

Microelectronics Reliability

Volumn 38, Issue 5, 1998, Pages 807-820

  Schneeweiss, Winfrid G ^a  

^a UNIVERSITY OF HAGEN   (Germany)

Author keywords

Binary decision diagram; Fault tree; Petri net; Reliability block diagram; S dependent primary events

Indexed keywords

DECISION THEORY; FAULT TREE ANALYSIS; GRAPH THEORY; MATHEMATICAL MODELS; PETRI NETS;

BINARY DECISION DIAGRAMS (BDD);

DIGITAL CIRCUITS;

EID: 0032064153     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(98)00013-4     Document Type: Article

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