Outdoor exposure tests of photovoltaic modules in Japan and overseas

Renewable Energy

Volumn 14, Issue 1-4, 1998, Pages 95-100

  Ikisawa, Masakatsu ^a   Nakano, Akihiko ^a   Igari, Sanekazu ^a   Terashima, Hisaei ^a  

^a HIC Bldg 2F 4598   (Japan)

Author keywords

Amorphous silicon; Degradation; Efficiency; Heat insulator; Oman; Outdoor exposure test

Indexed keywords

AMORPHOUS MATERIALS; DEGRADATION; EFFICIENCY; SEMICONDUCTING SILICON; TESTING; THERMAL INSULATING MATERIALS;

OUTDOOR EXPOSURE TESTS;

PHOTOVOLTAIC CELLS;

EID: 0032058357     PISSN: 09601481     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0960-1481(98)00053-6     Document Type: Article

References (4)

1. Imura, Y. (1997), Technical Analysis of PV Module D. C. Characteristics at JQA, Abstracts ISES 1997 Solar World Congress, Taejon, Korea, 181-183.
2. National Astronomical Observatory, (1997), Chronological Scientific Tables, Maruzen Co., Ltd, Tokyo.
3. Staebler, D. L. and Wronski C.R. (1977), Appl. Phys. Lett. 31, 292-294.
4. Yamawaki, T. (1996), Thermal Recovery Effect on Light-Induced Degradation of Amorphous Silicon Solar Module under Sunlight, Technical Digest of International PVSEC-9 Miyazaki, Japan, 9 · 455-456.