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Volumn 38, Issue 12, 1998, Pages 1755-1761
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On the texture evolution in swaged Cu-based wires
a,c b,c a,c a,c b |
Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
COPPER;
CRYSTAL MICROSTRUCTURE;
CRYSTAL ORIENTATION;
CRYSTALLIZATION;
ELECTRIC CONDUCTIVITY MEASUREMENT;
METALLIC MATRIX COMPOSITES;
PLASTIC DEFORMATION;
PLASTIC FLOW;
STRAIN;
SWAGING;
TEXTURES;
ORIENTATION DISTRIBUTION FUNCTIONS (ODF);
WIRE;
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EID: 0032058131
PISSN: 13596462
EISSN: None
Source Type: Journal
DOI: 10.1016/s1359-6462(98)00114-6 Document Type: Article |
Times cited : (19)
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References (15)
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