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Volumn 38, Issue 12, 1998, Pages 1755-1761

On the texture evolution in swaged Cu-based wires

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COPPER; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY MEASUREMENT; METALLIC MATRIX COMPOSITES; PLASTIC DEFORMATION; PLASTIC FLOW; STRAIN; SWAGING; TEXTURES;

EID: 0032058131     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/s1359-6462(98)00114-6     Document Type: Article
Times cited : (19)

References (15)
  • 14


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.