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Volumn 38, Issue 5, 1998, Pages 673-680

Low energy (10 to 700 eV) angularly resolved sputtering yields for D+ on beryllium

Author keywords

[No Author keywords available]

Indexed keywords

BERYLLIUM; DEUTERIUM; PLASMAS;

EID: 0032057954     PISSN: 00295515     EISSN: None     Source Type: Journal    
DOI: 10.1088/0029-5515/38/5/303     Document Type: Article
Times cited : (14)

References (44)
  • 26
    • 0031273306 scopus 로고    scopus 로고
    • Sputtering erosion of Be-coated plasma facing components -general considerations and analysis for ITER detached plasma regime
    • in press
    • BROOKS, J.N., RUZIC, D.N., HAYDEN, D.B., Sputtering erosion of Be-coated plasma facing components -general considerations and analysis for ITER detached plasma regime, J. Fusion Eng. Des. (in press).
    • J. Fusion Eng. Des.
    • Brooks, J.N.1    Ruzic, D.N.2    Hayden, D.B.3
  • 38
    • 0003587776 scopus 로고
    • Lockheed Martin Idaho Technologies, Idaho Natl Engineering Lab., Idaho Falls
    • DAHL, D.A., SIMION3D Version 6.0, Lockheed Martin Idaho Technologies, Idaho Natl Engineering Lab., Idaho Falls (1995).
    • (1995) SIMION3D Version 6.0
    • Dahl, D.A.1
  • 40
    • 0000503141 scopus 로고
    • Quantification of AES and XPS
    • BRIGGS, D., SEAH, M.P., Eds
    • SEAH, M.P., "Quantification of AES and XPS", Practical Surface Analysis, Vol. 1 (BRIGGS, D., SEAH, M.P., Eds), (1990).
    • (1990) Practical Surface Analysis , vol.1
    • Seah, M.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.