TEM, STM and AFM as tools to study clusters and colloids

Micron

Volumn 29, Issue 2-3, 1998, Pages 183-190

  Hornyak, G L ^a   Peschel, St ^a   Sawitowski, Th ^a   Schmid, G ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

Atomic force microscopy; Clusters; Colloids; High resolution transmission electron microscopy; Quantum size effects; Scanning tunneling microscopy

Indexed keywords

EID: 0032053317     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(97)00058-9     Document Type: Article

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