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Volumn 48, Issue 4, 1998, Pages 34-42

Automated grading and defect detection: A review

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EID: 0032051395     PISSN: 00157473     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Review
Times cited : (40)

References (75)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.