Knowledge based method for touch probe configuration in an automated inspection system

Journal of Materials Processing Technology

Volumn 76, Issue 1-3, 1998, Pages 153-160

  Moroni, G ^a   Polini, W ^b   Semeraro, Q ^b  

^a UNIVERSITY OF CASSINO AND SOUTHERN LAZIO   (Italy)

^b POLITECNICO DI MILANO   (Italy)

Author keywords

CAIP; CAPP; Coordinate measuring machine; Dimensional inspection; Knowledge based system; Touch probe

Indexed keywords

COMPUTER AIDED MANUFACTURING; FACTORY AUTOMATION; KNOWLEDGE BASED SYSTEMS; PRODUCT DESIGN;

COMPUTER AIDED INSPECTION PLANNING (CAIP) SYSTEMS; COORDINATE MEASURING MACHINES (CMM); TOUCH PROBE SELECTION;

INSPECTION;

EID: 0032051041     PISSN: 09240136     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-0136(97)00336-1     Document Type: Article

References (10)

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