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Volumn 401, Issue 3, 1998, Pages 427-433

High-resolution Si 2p core-level photoemission spectroscopy on Sb-terminated Si(100) surfaces: Evidence for a strong interfacial component

(3) Cricenti, A a Perfetti, P a Le Lay, G b

a CNR (Italy)

b AIX MARSEILLE UNIVERSITÉ (France)

Author keywords

Antimony; Metal semiconductor interfaces; Photoelectron emission; Semiconducting surfaces; Silicon; Synchrotron radiation photoelectron spectroscopy

Indexed keywords

ADSORPTION; INTERFACES (MATERIALS); PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; SEMICONDUCTING ANTIMONY; SEMICONDUCTING SILICON; SYNCHROTRON RADIATION;

HIGH RESOLUTION CORE LEVEL SPECTROSCOPY; METAL SEMICONDUCTOR INTERFACES; SEMICONDUCTING SURFACES;

SURFACES;

EID: 0032051035 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(98)00048-X Document Type: Article

Times cited : (19)

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