Structure characterization of metallic multilayers by symmetric and asymmetric X-ray diffraction

Thin Solid Films

Volumn 319, Issue 1-2, 1998, Pages 78-80

  Gladyszewski, G ^a   Labat, S ^b   Gergaud, P ^b   Thomas, O ^b  

^a LUBLIN UNIVERSITY OF TECHNOLOGY   (Poland)

^b CNRS   (France)

Author keywords

Au Ni multilayers; Structure characterization; X ray diffraction

Indexed keywords

COMPUTER SIMULATION; CRYSTAL SYMMETRY; LATTICE CONSTANTS; MONTE CARLO METHODS; STRESS ANALYSIS; X RAY CRYSTALLOGRAPHY;

INTERPLANAR DISTANCES;

METALLIC SUPERLATTICES;

EID: 0032050944     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)01089-4     Document Type: Article

References (4)

1. B. Gilles, J. Eymery, A. Marty, J.C. Joud, A. Chamberod, Mater. Res. Soc. Proc. 237 (1992) 511.
2. I. Noyan, J. Cohen (Eds.), Residual Stresses, Springer- Verlag, Stuttgart, 1987.
3. G. Gladyszewski, Thin Solid Films 204 (1991) 473.
4. S. Labat, O. Thomas, P. Gergaud, A. Charai, C. Alfonso, L. Barrallier, B. Gilles, A. Marty, J. Phys. IV 6 (1996) C7-C135.