Apparatus for the continuous monitoring of surface morphology via fluorescence microscopy during monolayer transfer to substrates

Langmuir

Volumn 14, Issue 9, 1998, Pages 2567-2572

  Lee, Ka Yee C ^a   Lipp, Michael M ^a   Takamoto, Dawn Y ^a   Ter Ovanesyan, Evgeny ^a   Zasadzinski, Joseph A ^a   Waring, Alan J ^b  

^a University of California   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALS; FLUORESCENCE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GERMANIUM; IMAGING TECHNIQUES; LIPIDS; MORPHOLOGY; PHASE INTERFACES; PROTEINS; SUBSTRATES;

ATTENUATED TOTAL REFLECTION; FLUORESCENCE MICROSCOPY;

MONOLAYERS;

EID: 0032049616     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la9704213     Document Type: Article

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