Microstructure imaging of the YBCO thin film/MgO substrate interface: HRTEM and Fourier analysis of the Moiré fringe pattern

Thin Solid Films

Volumn 319, Issue 1-2, 1998, Pages 163-167

  Auzary, S ^a   Pailloux, F ^a   Denanot, M F ^a   Gaboriaud, R J ^a  

^a UNIVERSITÉ DE POITIERS   (France)

Author keywords

Fourier analysis; HRTEM; MgO substrate

Indexed keywords

CRYSTAL ORIENTATION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GRAIN BOUNDARIES; INTERFACES (MATERIALS); MAGNESIA; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM COMPOUNDS;

MOIRE FRINGE PATTERN; YTTRIUM BARIUM COPPER OXIDE;

SUPERCONDUCTING FILMS;

EID: 0032049290     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)01114-0     Document Type: Article

References (5)

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