Edge-defined film-fed (EFG) growth of rare-earth orthovanadates REVO4 (RE = Y, Gd): Interface morphology effect on crystal shape and material properties

Journal of Crystal Growth

Volumn 186, Issue 4, 1998, Pages 607-611

  Epelbaum, Boris M ^a   Shimamura, Kiyoshi ^a   Inaba, Katsuhiko ^a   Uda, Satoshi ^b   Kochurikhin, Vladimir V ^a,d   Machida, Hiroshi ^c   Terada, Yasuko ^a   Fukuda, Tsuguo ^a  

^a TOHOKU UNIVERSITY   (Japan)

^b MITSUBISHI MATERIALS CORPORATION   (Japan)

^c Chichibu Onoda Cement Corp   (Japan)

^d PROKHOROV GENERAL PHYSICS INSTITUTE   (Russian Federation)

Author keywords

EFG method; Faceting; Interface stability; Melt; Properties; Rare earth orthovanadate; Shaped crystal growth; Structure

Indexed keywords

CRYSTAL GROWTH; FILM GROWTH; MORPHOLOGY; SINGLE CRYSTALS;

EDGE DEFINED FILM FED GROWTH (EFG); INTERFACE STABILITY; RARE EARTH ORTHOVANADATES; SHAPED CRYSTAL GROWTH;

VANADIUM COMPOUNDS;

EID: 0032049027     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(97)00601-5     Document Type: Article

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