Optimum estimators for the Weibull distribution from censored test data: Progressively-censored tests

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 5, Issue 2, 1998, Pages 157-164

  Montanari, G C ^a   Mazzanti, G ^a   Cacciari, M ^b   Fothergill, J C ^c  

^a UNIVERSITY OF BOLOGNA   (Italy)

^b UNIVERSITY OF PARMA   (Italy)

^c UNIVERSITY OF LEICESTER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC BREAKDOWN OF SOLIDS; LEAST SQUARES APPROXIMATIONS; MONTE CARLO METHODS; PARAMETER ESTIMATION; WEIBULL DISTRIBUTION;

WHITE TECHNIQUE;

ELECTRIC INSULATION TESTING;

EID: 0032048966     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/94.671923     Document Type: Article

References (20)

1. W. Weibull, "A Statistical Distribution Function of Wide Applicability", J. Appl. Mech., Vol. 18, pp. 293-297, 1951.
2. L. A. Dissado and J. C. Fothergill, Electrical Degradation and Breakdown in Polymers, Peter Peregrinus Ltd., 1992, Chapter 14.
3. G. C. Montanari, G. Mazzanti, M. Cacciari and J. C. Fothergill, "Optimum Estimators for the Weibull Distribution for Data from Censored Tests. Part 1: Singly-Censored Tests", IEEE Trans. Dielectrics EI, Vol. 4 (4), pp. 462-469, August 1997.
4. G. C. Montanari, G. Mazzanti, M. Cacciari and J. C. Fothergill, "In Search of Convenient Techniques for Reducing Bias in the Estimation of Weibull Parameters for Uncensored Test Data", IEEE Trans. Dielectrics EI, Vol. 4 (3), pp. 306-313, June 1997
5. G. C. Stone and H. Rosen, "Some Graphical Techniques for Estimating Weibull Confidence Limits", IEEE Trans. Reliab., Vol. 33, part 5, pp. 362-369, Dec. 1984
6. (see also: IEEE ANSI/IEEE Std. 930-1987, Guide for the statistical analysis of voltage endurance data for electrical insulation, 1987)
7. R. B. Abernethy (Author and Publisher), The New Weibull Handbook, 1993
8. J. F. Lawless, Statistical models and methods for lifetime data, J. Wiley and Sons, New York, 1982
9. W. Nelson, Accelerated Testing, John Wiley & Sons, New York, 1990
10. J. C. Fothergill, "Estimating the Cumulative Probability of Failure Data Points to be Plotted on Weibull and Other Probability Paper", IEEE Trans EI, Vol. 25 (3), pp. 489-492, June 1990.
11. J. Jacquelin, "A Reliable Algorithm for the Exact Median Rank Function", IEEE Trans. EI, Vol. 28 (2), pp. 168-171 April 1993 (and Erratum: Vol. 28 (5), p. 892, October 1993)
12. M. Cacciari and G. C. Montanari, "A Method to Estimate the Weibull Parameters for Progressively-Censored Tests", IEEE Trans. Reliab., Vol. R36 (1), pp. 97-93, April 1987.
13. J. S. White, "The moments of Log-Weibull Order Statistics", Technometrics, Vol. 11 (2), pp. 373-386, May 1969.
14. R. Ross, "Graphical Methods for Plotting and Evaluating Weibull Distributed Data", Proc. 4th. ICPADM, Brisbane, Australia, Vol. 1, pp. 250-253, July 1994.
15. R. Y. Rubinstein, Simulation and the Monte Carlo Method, John Wiley and Sons, New York, 1981
16. G. C. Montanari, A. Cavallini, L. Tommasini and M. Cacciari:, "Comparison of Random Generators for Montecarlo Estimates of Weibull Parameters", Metron, Vol. LIII (2), pp. 55-77, June 1995.
17. M. Cacciari, G. Mazzanti and G. C. Montanari, "Comparison of Maximum Likelihood Unbiasing Methods for the Estimation of the Weibull Function Parameters", IEEE Trans. Dielectrics EI, Vol. 3 (1), pp. 18-27, February 1996.
18. A. Papoulis, Probability, random variables and stochastic processes, McGraw Hill, New York, 1965.
19. J. Jacquelin, "Inference of Sampling on Weibull Parameter Estimation", IEEE Trans. Dielectrics EI, Vol. 4 (1), pp. 146, February 1997.
20. R. M. Hill and L. A. Dissado, "Theoretical Basis for the Statistics of Dielectric Breakdown", J. Phys. C: Solid State Phys., Vol. 16, pp. 2145-56, 1983.