Mirror electron microscopy investigations of thin polyethylene films subjected to high voltage

Thin Solid Films

Volumn 317, Issue 1-2, 1998, Pages 235-236

  Godehardt, R ^a   Heydenreich, J ^a   Popescu Pogrion, N ^b   Tirnovan, M ^c  

^a M P Inst fur Mikrostrukturphysik   (Germany)

^b NATIONAL INSTITUTE OF MATERIALS PHYSICS   (Romania)

^c UNIVERSITY POLITEHNICA OF BUCHAREST   (Romania)

Author keywords

Electron Microscopy; High Voltage; Mirror; Thin Polyethylene films

Indexed keywords

DEPOSITION; DIELECTRIC FILMS; ELECTRIC BREAKDOWN OF SOLIDS; ELECTRON MICROSCOPY; MIRRORS; POLYETHYLENES;

HIGH VOLTAGE; MIRROR ELECTRON MICROSCOPY;

THIN FILMS;

EID: 0032048750     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)00522-1     Document Type: Article

References (5)

1. R. Godehardt, Thesis, Martin Luther University, Halle-Wittenberg, Germany, 1989.
2. N. Popescu-Pogrion, M. Chipara, A. Ifrim, V. Panaite, P. Notingher, Lees Vide, Les Couches Minces Suppl. 260 (1-2) (1992) 38O.
3. J. Heydenreich, Proceedings of the Sixth International Congress for Electron Microscopy, Kyoto. Maruzen, Nichonbashi, Tokyo, 1966, p. 233.
4. H. Bethge, J. Heydenreich, Advances in Optical and Electron Microscopy, Vol. 4, in: R. Barer, V.E. Casslett (Eds.), Academic Press, 1971, p. 237.
5. R. Godehardt, J. Heydenreich, N. Popescu-Pogrion, P. Notingher, I. Radu, Proceedings of the 13th International Conference on Electron Microscopy, Les Editions de Physique, Vol. 2B, 1994, p. 1.