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Thin Solid Films

Volumn 317, Issue 1-2, 1998, Pages 198-201

Structure and elastic properties of thin alloyed gold films

(7) Beghi, M G a Bottani, C E a Guzman, L b Lafford, T c Laidani, N b Ossi, P M a Tanner, B K d

a POLITECNICO DI MILANO (Italy)

b Centro Materiali Biofisica Medica (Italy)

c Bede Scientific Instruments Ltd (United Kingdom)

d DURHAM UNIVERSITY (United Kingdom)

Author keywords

Scattering; Thin films; X ray diffraction

Indexed keywords

ACOUSTIC PROPERTIES; BRILLOUIN SCATTERING; DENSITY MEASUREMENT (SPECIFIC GRAVITY); ELASTICITY; GOLD; MAGNETRON SPUTTERING; METALLIC FILMS; SILICON WAFERS; SURFACE ROUGHNESS; SURFACE STRUCTURE; THICKNESS MEASUREMENT; X RAY POWDER DIFFRACTION;

FILM DENSITY; FILM STRUCTURE; FILM THICKNESS; GOLD FILM; X RAY REFLECTIVITY;

THIN FILMS;

EID: 0032048749 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(97)00619-6 Document Type: Article

Times cited : (4)

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