SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 317, Issue 1-2, 1998, Pages 241-244

Yttria-stabilized zirconia obtained by MOCVD: Applications

(7) Garcia, G a Figueras, A a Casado, J b Llibre, J b Mokchah, M c Petot Ervas, G c Calderer, J b

a CSIC (Spain)

b SE Carburos Metálicos ^* (Spain)

c ECOLE CENTRALE PARIS (France)

Author keywords

Electrodes; MOCVD; YS2

Indexed keywords

ALUMINA; CHARACTERIZATION; ELECTRIC IMPEDANCE MEASUREMENT; ELECTRODES; LANTHANUM COMPOUNDS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MULTILAYERS; POROUS MATERIALS; SOLID ELECTROLYTES; ZIRCONIA;

LANTHANUM STRONTIUM MANGANITE; ORGANOMETALLIC PRECURSORS; SPECTRAL COMPLEX IMPEDANCE MEASUREMENT; YTTRIA-STABILIZED ZIRCONIA;

THIN FILMS;

EID: 0032048371 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(97)00622-6 Document Type: Article

Times cited : (20)

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