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Volumn 13, Issue 4, 1998, Pages 965-973

Oxidation of MoSi2/SiC nanolayered composite

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; CARBON STEEL; COMPOSITION; CRYSTAL MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; OXIDATION; PROTONS; SCANNING ELECTRON MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; SINGLE CRYSTALS; SPUTTERING; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0032048219     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1998.0135     Document Type: Article
Times cited : (10)

References (23)
  • 20
    • 0040514980 scopus 로고
    • edited by E. Broszeit, W. D. Müz, H. Oesschner, K-T. Rie, and G. K. Wolf DGM Informationsgesellschaft mbH, Germany
    • J-P. Hirvonen, R. Lappalainen, A. Anttila, and E. Sirviö, in Plasma Surface Engineering, edited by E. Broszeit, W. D. Müz, H. Oesschner, K-T. Rie, and G. K. Wolf (DGM Informationsgesellschaft mbH, Germany, 1989), p. 721.
    • (1989) Plasma Surface Engineering , pp. 721
    • Hirvonen, J.-P.1    Lappalainen, R.2    Anttila, A.3    Sirviö, E.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.