State analysis of fluorides with rare earth elements in electron probe X-ray microanalysis

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 37, Issue 4 PART A, 1998, Pages 2070-2071

  Takahashi, Hideyuki ^a   Minato, Ichiro ^a   Kondo, Yuji ^a  

^a JEOL LTD   (Japan)

Author keywords

Electron probe X ray microanalyser; F k ; Fluorides with rare earth elements; Intensity ratio; Satellite k 3,4, valence electron

Indexed keywords

ELECTRON ENERGY LEVELS; EMISSION SPECTROSCOPY; MICROANALYSIS; RARE EARTH ELEMENTS;

ELECTRON PROBE X RAY MICROANALYSIS;

FLUORINE COMPOUNDS;

EID: 0032048190     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.37.2070     Document Type: Article

References (1)

1. M. Fialin and G. Remond: Microbeam Anal. 2 (1993) 179.