A secondary discharge intensifies optical emission from a Mach disk extracted from an inductively coupled plasma

Journal of Analytical Atomic Spectrometry

Volumn 13, Issue 4, 1998, Pages 223-228

  Amad, Ma'an H ^a   Houk, R S ^a  

^a IOWA STATE UNIVERSITY   (United States)

Author keywords

Atomic emission spectrometry; Charge coupled device detectors; Echelle spectrometer; Inductively coupled plasma; Inductively coupled plasma mass spectrometry; Mach disk; Secondary discharge; Supersonic jet

Indexed keywords

ARGON; ATOMIC SPECTROSCOPY; CHARGE COUPLED DEVICES; JETS; LIGHT EMISSION; MASS SPECTROMETRY; PLASMA APPLICATIONS; QUARTZ APPLICATIONS; SODIUM CHLORIDE; SPECTROMETERS; SUPERSONIC FLOW;

ATOMIC EMISSION SPECTROMETRY (AES); DETECTION LIMITS; ECHELLE SPECTROMETERS; INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY (ICPMS); MACH DISKS; SECONDARY DISCHARGE; SUPERSONIC JETS;

EMISSION SPECTROSCOPY;

EID: 0032048129     PISSN: 02679477     EISSN: None     Source Type: Journal    
DOI: 10.1039/a704272h     Document Type: Article

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