Detection and Characterization of Isolated and Overlapping Spots

Computer Vision and Image Understanding

Volumn 70, Issue 1, 1998, Pages 23-35

  Noordmans, H J ^a   Smeulders, A W M ^a  

^a UNIVERSITY OF AMSTERDAM   (Netherlands)

Author keywords

Correlation technique; Overlapping spots; Spot detection; Wavelet transform

Indexed keywords

IMAGE PROCESSING; PATTERN RECOGNITION; SIGNAL TO NOISE RATIO;

SPOTS DETECTION;

OBJECT RECOGNITION;

EID: 0032048038     PISSN: 10773142     EISSN: None     Source Type: Journal    
DOI: 10.1006/cviu.1998.0604     Document Type: Article

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