An improved p chart through simple adjustments

Journal of Quality Technology

Volumn 30, Issue 2, 1998, Pages 142-151

  Chen, Gemai ^a,b,c  

^a UNIVERSITY OF REGINA   (Canada)

^b Department Mathematics Statistics ^*  (Canada)

^c Quality Professionals' Resource Center   (Canada)

Author keywords

Binomial Distribution; Control Charts

Indexed keywords

DATA REDUCTION; MATHEMATICAL TRANSFORMATIONS; PARAMETER ESTIMATION; PROBABILITY; RANDOM PROCESSES;

P CHARTS;

QUALITY CONTROL;

EID: 0032047690     PISSN: 00224065     EISSN: None     Source Type: Journal    
DOI: 10.1080/00224065.1998.11979833     Document Type: Article

References (4)

1. QUESENBERRY, C. P. (1991). "SPC Q Charts for Binomial Parameter p: Short or Long Runs". Journal of Quality Technology 23, pp. 239-246.
2. QUESENBERRY, C. P. (1995). "On Properties of Binomial Q Charts for Attributes". Journal of Quality Technology 27, pp. 204-213.
3. RYAN, T. P. (1989). Statistical Methods For Quality Improvement. John Wiley & Sons, New York, NY.
4. WINTERBOTTOM, A. (1993). "Simple Adjustments to Improve Control Limits on Attribute Charts". Quality and Reliability Engineering International 9, pp. 105-109.