Simulation of the scanning tunneling and atomic force microscopy images of a xanthine monolayer on graphite

Surface Science

Volumn 401, Issue 3, 1998, Pages 476-481

  Jung, D ^a   Seo, D K ^b   Ren, J ^b   Whangbo, M H ^b  

^a Wonkwang University   (South Korea)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

Atomic force microscopy; Density plot calculations; Image simulation; Scanning tunneling microscopy; Xanthine monolayer

Indexed keywords

ADSORPTION; ATOMIC FORCE MICROSCOPY; CALCULATIONS; CRYSTAL LATTICES; GRAPHITE; MOLECULES; ORGANIC COMPOUNDS; SCANNING TUNNELING MICROSCOPY;

DENSITY PLOT CALCULATIONS; IMAGE SIMULATION; XANTHINE;

MONOLAYERS;

EID: 0032046370     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(98)00069-7     Document Type: Article

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