SCOPUS 정보 검색 플랫폼

Volumn 317, Issue 1-2, 1998, Pages 137-139

Formation and evaluation of CeN thin films

Author keywords

Cerium; Ion plating; Nitride; XPS

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRON ENERGY LEVELS; ENERGY GAP; FILM PREPARATION; NITRIDES; STOICHIOMETRY; X RAY PHOTOELECTRON SPECTROSCOPY;

CERIUM NITRIDE FILM; ION PLATING; OPTICAL BAND GAP;

THIN FILMS;

EID: 0032046028 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(97)00610-X Document Type: Article

Times cited : (34)

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