Electrodeposited CuInSe2 thin film junctions

NASA Conference Publication

Volumn , Issue 208413, 1998, Pages 47-

  Raffaelle, R P ^a   Mantovani, J G ^a   Bailey, S G ^a   Hepp, A F ^a   Gordon, E M ^a   Haraway, R ^a  

^a Wilberforce University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CARRIER CONCENTRATION; COPPER ALLOYS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRODEPOSITION; ENERGY GAP; MORPHOLOGY; POLYCRYSTALLINE MATERIALS; SEMICONDUCTING FILMS; SEMICONDUCTING INDIUM COMPOUNDS; STOICHIOMETRY; THIN FILMS;

ABSTRACT ONLY; COPPER INDIUM DISELENIDE; ENERGY DISPERSIVE SPECTROSCOPY (EDS);

SEMICONDUCTOR JUNCTIONS;

EID: 0032045747     PISSN: 01917811     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)