Methods of dislocation distribution analysis and inclusion identification with application to CdTe and (Cd,Zn)Te

Journal of Physics D: Applied Physics

Volumn 31, Issue 8, 1998, Pages 1009-1016

  Rose, D ^a   Durose, K ^a   Palosz, W ^b   Szczerbakow, A ^c   Grasza, K ^c  

^a DURHAM UNIVERSITY   (United Kingdom)

^b NASA MARSHALL SPACE FLIGHT CENTER   (United States)

^c INSTITUTE OF PHYSICS   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GROWTH FROM MELT; DISLOCATIONS (CRYSTALS); ETCHING; INCLUSIONS; SCANNING ELECTRON MICROSCOPY; X RAY ANALYSIS;

ENERGY DISPERSIVE X RAY ANALYSIS (EDX); ETCH PIT DISTRIBUTIONS; POISSON DISTRIBUTION;

SEMICONDUCTING CADMIUM COMPOUNDS;

EID: 0032045515     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/31/8/012     Document Type: Article

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