RBS measurement of depth profiles of erbium incorporated into lithium niobate for optical amplifier applications

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 139, Issue 1-4, 1998, Pages 208-212

  Peřina, Vratislav ^a   Vacík, Jiří ^a   Hnatovicz, Vladimír ^a   Červená, Jarmila ^a   Kolářová, Pavla ^b   Špirková Hradilová, Jarmila ^b   Schröfel, Josef ^c  

^a NUCLEAR PHYSICS INSTITUTE   (Czech Republic)

^b INSTITUTE OF CHEMICAL TECHNOLOGY   (Czech Republic)

^c CZECH TECHNICAL UNIVERSITY IN PRAGUE   (Czech Republic)

Author keywords

Depth profiling; Erbium; Lithium niobate; Optical amplifiers; Optical waveguides

Indexed keywords

COMPOSITION; ERBIUM; LITHIUM COMPOUNDS; OPTICAL WAVEGUIDES; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTOR DOPING; SEMICONDUCTOR LASERS; SINGLE CRYSTALS;

LITHIUM NIOBATE;

NUCLEAR INSTRUMENTATION;

EID: 0032044862     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)01008-2     Document Type: Article

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