Performance of random-walk capacitance extractors for IC interconnects: A numerical study

Solid-State Electronics

Volumn 42, Issue 4, 1998, Pages 581-588

  Le Coz, Y L ^a   Greub, H J ^a   Iverson, R B ^b  

^a RENSSELAER POLYTECHNIC INSTITUTE   (United States)

^b Random Logic Corp   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; COMPUTER AIDED NETWORK ANALYSIS; COMPUTER SOFTWARE; PROBABILITY; RANDOM PROCESSES;

INTEGRATED CIRCUIT INTERCONNECTS; RANDOM WALK CAPACITANCE EXTRACTORS;

INTEGRATED CIRCUIT LAYOUT;

EID: 0032043204     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(97)00283-9     Document Type: Article

References (13)

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