Hot-carrier reliability in N-MOSFETs used as pass-transistors

Microelectronics Reliability

Volumn 38, Issue 4, 1998, Pages 539-544

  Goguenheim, D ^a   Bravaix, A ^a   Vuillaume, D ^b   Varrot, M ^c   Revil, N ^c   Mortini, P ^c  

^a ISEM   (France)

^b Institut Superieur de l'Electronique et du Numerique   (France)

^c STMICROELECTRONICS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC CURRENTS; HOT CARRIERS; RELIABILITY; SEMICONDUCTOR DEVICE MODELS;

HOT CARRIER RELIABILITY; PASS-TRANSISTORS;

MOSFET DEVICES;

EID: 0032042724     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(97)00217-5     Document Type: Article

References (8)

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