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Volumn 38, Issue 4, 1998, Pages 531-537

Methodology for creating "rejuvenating" devices

Author keywords

[No Author keywords available]

Indexed keywords

POLYNOMIALS; SEMICONDUCTOR DEVICES;

EID: 0032042723     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(97)00229-1     Document Type: Article
Times cited : (1)

References (22)
  • 12
    • 11544250268 scopus 로고
    • Semiconductor Reliability Predictions from Life Distribution Data
    • ed. J. E. Shwop. Elizabeth, New Jersey
    • Peck, D. S., Semiconductor Reliability Predictions from Life Distribution Data, in Proceedings of the Conference on Reliability of Semiconductor Devices, ed. J. E. Shwop. Elizabeth, New Jersey, 1961, pp. 78-100.
    • (1961) Proceedings of the Conference on Reliability of Semiconductor Devices , pp. 78-100
    • Peck, D.S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.