Front tracking in two and three dimensions

Computers and Mathematics with Applications

Volumn 35, Issue 7, 1998, Pages 1-11

  Glimm, J ^a   Graham, M J ^a   Grove, J ^a   Li, X L ^a   Smith, T M ^a   Tan, D ^a   Tangerman, F ^a   Zhang, Q ^a  

^a STONY BROOK UNIVERSITY   (United States)

Author keywords

Deposition and etching processes; Front tracking; Richtmyer Meshkov instability; Riemann problems

Indexed keywords

COMPUTER ARCHITECTURE; COMPUTER SIMULATION; ETCHING; PARALLEL PROCESSING SYSTEMS; SEMICONDUCTOR DEVICE MANUFACTURE; THREE DIMENSIONAL;

COMPUTER CHIP MANUFACTURING PROCESS; FRONT TRACKING; RICHTMYER-MESHKOV INSTABILITY; RIEMANN PROBLEMS;

COMPUTATION THEORY;

EID: 0032042552     PISSN: 08981221     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0898-1221(98)00028-5     Document Type: Article

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